With the rapid and explosive growth of the LED general lighting market, on the one hand, industry competition is becoming increasingly fierce. On the other hand, intelligent lighting, which can take advantage of LED light sources and represent the future development direction, has become a hot word in industry development this year. Smart lighting, which seems to have endless potential, has undoubtedly become a hardware part of large systems such as smart homes, smart buildings, and smart cities. In the future development pattern where cross-border integration has become inevitable, perhaps practicing internal skills and effectively reshaping light quality and light environment is the fundamental foothold for the survival and development of LED lighting companies.
In the critical period of transformation, upgrading and development of the semiconductor lighting industry, what kind of voice and signal will the 11th China International Semiconductor Lighting Forum (SSLCHINA 2014) convey to the industry from a global perspective, represent the most mainstream voice in the industry, and lead the future development of the industry? This forum will be grandly opened at the Westin Hotel of Guangzhou Canton Fair on November 6-8, 2014.
Dr. Yoshi Ohno, leader of the light color quantification group of the National Institute of Standards and Technology, will serve as a special speaker at the opening ceremony of the forum and will share his latest research results with participants from the perspective of LED lighting colorimetry and LED lighting color quality improvement.
Dr. Yoshi Ohno graduated from Kyoto University, Japan, and then worked at Panasonic Lighting Research Laboratory. In 1992, Dr. Yoshi Ohno officially joined the National Institute of Standards and Technology (NIST) as a leader in photometric measurement research. From 2003 to 2012, he served as the leader of the optical sensor group, illumination and color group, and was appointed as a NIST researcher in 2010. Dr. Yoshi Ohno's research fields are very wide, covering everything from basic theoretical research to the application of photometry and colorimetry. His research directions include: integrating sphere, luminous flux measurement, light source colorimetry, color reproduction, spectral radiometry, flash light measurement and semiconductor solid-state lighting.
Recently, Dr. Yoshi Ohno has been very active in research on the color quality of LED light sources. His research on the simulation and analysis of LED light source colors is well known and has been widely used in the industrialization process of LED lighting. As early as 2008, a team led by Dr. Yoshi Ohno developed a new test method that can measure any specific junction temperature of high-power LEDs. The new test method is based on a temperature-controlled heat sink that regulates the LED chip to any junction temperature. This method is better than using DC to test the LED output. These heat sinks are cheap and widely available, and the team says the method is applicable to a variety of high-power LEDs, including arrays of LEDs connected in series.
At the same time, Dr. Yoshi Ohno is very active in the promotion of global solid-state lighting standards. He has long been involved in the formulation of multiple standards and serves as the technical vice president of the International Commission on Illumination (CIE). He is the person in charge of the CIE TC2-71 international LED lamps, illuminance and module test methods, and serves as the chairman of two divisions at the same time.
He has won many international awards, such as the Arthur S. Flemming Award in 2006; the CIE de Boer Gold Pin Quality Service Award in 2007; and the U.S. Department of Commerce Silver Medal in 2009.
We look forward to Dr. Yoshi Ohno bringing us the latest technological research and application results in this direction from the perspective of light color quality of LED light sources. Thank you for your attention and sincerely invite your participation. Let’s meet at the SSLCHINA 2014 industry event on November 6-8, 2014.
ANNA