On September 19, Jingce Electronics (300567) Micro-LED CT AOI testing equipment was successfully shipped out of the machine and officially delivered to a provincial laboratory customer. This laboratory is the first local provincial laboratory approved by the local provincial party committee and provincial government, and is an independent legal entity organized by a local 211 university. This is the first time that Micro-LED CT AOI equipment independently developed by Jingce Electronics has been successfully delivered in the field of industry, academia and research in university laboratories, marking another important breakthrough for Jingce Electronics in the field of pan-semiconductor testing.
The wafer appearance inspection equipment independently developed by Jingce Electronics is mainly used in semiconductor wafer factories, packaging and testing factories and Micro-LED, Mini-LED new display wafer front and rear defect detection: It mainly uses micro-optical solutions to detect and measure μm-level appearance defects of the wafer; it can also be extended to wafer bumping 3D measurement and LED 3D measurement applications. The wafer appearance inspection machine equipment software is fully independently developed and has independent intellectual property rights. Combined with Jingce Electronics’ many years of technical experience in the field of quality inspection, it promotes the localization and application of wafer optical inspection equipment.
The smooth delivery of Micro-LED CT AOI testing equipment to provincial laboratories is another major breakthrough for Jingce Electronics in the pan-semiconductor testing board map. In the future, Jingce Electronics will continue to uphold its industry positioning as a yield management expert, deeply cultivate its brand, intensively cultivate its technology, promote the collaborative progress of the pan-semiconductor industry chain, and assist the rapid development of the industry.
ANNA